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A digital graphic shows a large circle with a grid pattern at the center, surrounded by a greenish glow—evoking wafer level burn in for AI chip reliability. On the left, there's a vertical bar chart with one tall teal bar and an empty box below it.

Aehr Test Systems and ISE Labs put wafer level burn in at the center of AI chip reliability

November 3, 2025 Gavin Bonshor 0

Aehr Test Systems and ISE Labs are pushing a simple idea into a complex part of the AI supply chain: stress AI dies earlier, while […]

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